Importation of Polish trichinellosis cases to Ireland, June 2007
نویسندگان
چکیده
منابع مشابه
Trichinellosis surveillance - United States, 2002-2007.
PROBLEM/CONDITION Trichinellosis is a parasitic disease caused by roundworms of the Trichinella genus. Humans are incidental hosts who become infected after ingestion of raw or undercooked meat containing encysted larvae of Trichinella spp. Common signs and symptoms of trichinellosis include eosinophilia, abdominal pain, fever, periorbital edema, and myalgia. National surveillance has documente...
متن کاملWorkshop held at University of Ulster , Coleraine , Northern Ireland ; 24 th – 27 th June 2007
s from the 7th International Comet Assay Workshop held at University of Ulster, Coleraine, Northern Ireland; 24th–27th June 2007 ORAL PRESENTATIONS SESSION 1: DNA DAMAGE AND REPAIR Overview: The use of the comet assay in DNA damage and repair studies. Andrew R. Collins Department of Nutrition, University of Oslo, Norway The comet assay measures DNA breaks, and in combination with lesion-specifi...
متن کاملAIM June 2007 Text.qxd
ACUPUNCTURE IN MEDICINE 2007;25(1-2):22-28. 22 www.acupunctureinmedicine.org.uk/volindex.php Introduction The use of acupuncture in Australia has significantly increased over recent years. From 1993 to 2000, the percentage of the population that consulted an acupuncturist in the previous 12 months increased from 2.0% to 2.8%. Similar prevalence estimates have been reported for other countries. ...
متن کاملIVJ June 2007.indd
Many factors influence litter size. These include genetics, gilt management, lactation length, parity distribution, disease, stress and boar fertility. In the past 20 years, litter size in Irish sows has increased by only one pig. Born alive figures now average at 11.2 pigs per litter. In this regard, Ireland is falling behind our European competitors who have made significant advances over thi...
متن کاملTCAD News, June 2007
Welcome to the latest issue of TCAD News. Over the years, TCAD has proven to be an enabling methodology for reducing technology development costs and time. The use of TCAD, however, extends beyond nanoscale silicon CMOS devices. In this issue, I am delighted to present articles showing the wide application of TCAD tools for modeling and analyzing physical phenomena and effects beyond nanoscale ...
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ژورنال
عنوان ژورنال: Weekly releases (1997–2007)
سال: 2007
ISSN: 9999-1233
DOI: 10.2807/esw.12.29.03239-en